Characterisation of
a CMOS Camera

hands-on training (EN)

Features, possibilities, limitations and optimisation of CMOS sensors

September 7th to 8th 2016

Speaker: Prof. Dr. Albert Theuwissen


This training is focusing on the extraction of all performance data of a solid-state camera without knowing what is inside the camera. The techniques learned are ideally suited to check what your competitor is doing or to benchmark the performance of your own camera with other products out in the market. The amount of characteristics of a camera that can be measured in dark (= day 1 of the training) as well as with light (= day 2 of the training) is astonishing. The participants will work in a team of 2 people and after a short introduction, to make them familiar with the hard- and software, they will start performing the camera evaluation themselves. The two day training is held by Dr. Albert Theuwissen in English.

Dr. Albert Theuwissen authored the book „Solid-State Imaging with Charge-Coupled Devices“. This work is still considered as one of the main textbooks in the field of solid-state imaging. In March 2001, he became part-time professor at the Delft University of Technology, the Netherlands. In Delft his main attention goes to the coaching of PhD students researching CMOS image sensors. In April 2002, he joined DALSA Corp. to act first as the company‘s Chief Technology Officer and later as the Chief Scientist of DALSA Semiconductors. After he left DALSA in September 2007, he founded Harvest Imaging and now he is fully focusing on training, coaching and teaching in the field of solid-state imaging technology. In 2008 Albert Theuwissen received the SMPTE‘s (Society for Motion Pictures and Television Engineers) Fuji Gold Medal for his contributions in research, development and education in the field of solid-state image capturing.

Find detailed information about this training here.


  • Experience the pros and cons of solid-state image sensors
  • Learn to evaluate an existing camera available on the market
  • Measure yourself the various noise components, temporal as well as fixed-pattern noise
  • Learn how to measure other electro-optical parameters such as MTF, QE, Blooming, linearity, full well, dynamic range,...

Target Group

Technical imaging experts and engineers who are involved in solid-state sensor measurements of their own products or in evaluation of their competitor's camera performance.  It should be noted that this course is mainly hands-on with a minimum about theory, so the training is intended for participants with minimum 1 or 2 years experience in soldi-state imaging.


1.490,00 € (plus VAT) per Person,
incl. trainings documentation, lunch and coffee breaks. 

Date and venue

September 7th to 8th 2016
9am - 5 pm

FRAMOS Office Taufkirchen:
Mehlbeerenstr. 2, 4th floor, 82024 Taufkirchen

If you‘re interested in a participation, we would be greatful for your application latest till August 29th.


Yes, I would like to participate at the following FRAMOS training:
Characterisation of a CMOS camera - hands-on training, with Dr. Albert Theuwissen

* Mandatory field